- Original Date Event: Wednesday, Sept. 16th, 2015
- Time: 2 pm Eastern Time
- Duration: 45 Minutes including Q&A
- Presenters: David Exline, Vice President, and Rebekah Byrne, Laboratory Manager, at Gateway Analytical
- Host: Paige Cohen, Sales Development Associate
This webinar will offer attendees insight into the value of using automated Raman and SEM-EDS for particle size, identification and classification as a cost effective and efficient method for understanding contamination and gaining diagnostic data.
Wear debris contamination is not a new problem within various industries: however, the way that the contamination is identified and monitored is evolving. Automated Raman coupled with automated SEM-EDS analysis allows you to evaluate size, shape, elemental distribution and characterization of particles within a single sample. These combined techniques provide particle information for organic, inorganic and metallic particles. This valuable information helps to assist with determining the root causes for specific failures, as well as predict failures even before they happen. Monitoring wear debris is essential to, but not limited to, medical manufacturing, aerospace and industrial manufacturing.
Highlighted Topics Include
- An overview of Raman and SEM-EDS technology and capabilities
- Common wear debris contamination challenges within different industries
- Benefits of monitoring wear debris
- Applications and examples of wear debris analyses
During this webinar we will discuss Raman and SEM-EDS technology and how it’s used to provide automated particle sizing and characterization. In addition, common wear debris contamination challenges and benefits will be covered. We will conclude with some applications and examples of wear debris analyses.
Who Should Attend?
You should attend this webinar if you are involved in guaranteeing the quality and safety of products before and/or after contamination failures and are looking for an effective method for monitoring wear debris contamination.
David Exline, Vice President, Gateway Analytical
David Exline has more than 20 years of experience in managing and administering analytical laboratory and consulting services. David has specific expertise in applying chemical imaging methods such as Raman, UV-Vis and NIR techniques to solve the most difficult pharmaceutical and material science problems for Gateway Analytical customers. David is adept in numerous pharmaceutical-related services and testing methods including: materials characterization, particulate contamination analysis, particle sizing and high-resolution microscopy.
Rebekah Byrne, Laboratory Manager, Gateway Analytical
Rebekah has more than six years of experience working under quality systems in both clinical and analytical laboratory settings, including cGMP and ISO environments. Rebekah worked as a genetics scientist for Perkin Elmer for two years before joining Gateway Analytical. She has worked specifically in materials characterization for more than four years, with a focus on both pharmaceutical forensics and criminal forensics.